I-V characteristics measurement is a intuitive, effective and widely used method. By measuring the I-V characteristic curve, the main physical properties of photovoltaic devices can be obtained, including photoelectric conversion efficiency, short-circuit current, opencircuit voltage, and fill factor. These are important for the research, quality inspection and application of photovoltaic devices. Zolix provides cost-effective I-V characteristic measurement systems and provides complete and professional technical support.

SCS600 is the second-generation product of the high-performance solar cell quantum efficiency / spectral response measurement system developed by Zolix. It can measure solar cells of various materials and is suitable for universities, research institutes and, R&D and production quality management in enterprises.

DSR600 is a multifunctional experimental platform which is based on spectral response measurement. The system employs a turnkey integrated design, which can carry out Spectral Response, the QE, Reflectivity, Mapping testing functions automatically. It conforms to the national standard measurement method and is an essential tool for the study of spectral response of optoelectronic devices and materials.

DSR300 series micro-nano spectral response measurement system is dedicated to low-dimensional materials, providing high-precision spectral scanning and photo current scanning measurement. 40 m detection spot make the system can measure the minimum size 100 μm sample. Ultra-high stability light source provide the high accuracy; Multiple light sources can be integrated in the system to measure a variety of detectors. The friendly software is easy to use and automatically control the device to operate.

Micro-nano Photoelectric imaging measurement system uses microscopic imaging technique, multi excitation light paths, to provide stable, little size monochromatic light to a photovoltaic test device. Its functions are characterizing the short-circuit current distributions, surface defect, and reflectivity in electronic devices.

DSR900 Camera Characteristics Measurement System is an advanced multi-functional test tool for evaluation of CCD and CMOS cameras and imaging sensors.

The system uses a dual light source configuration that complies with the latest IEC60904 standard, using xenon and tungsten lamps to cover the entire range of the solar spectrum. The light source features ultra-high light intensity stability, thus ensuring the high repeatability of the system test results.